Spectroscopie fluorescente à laser de l'hydrogène atomique en présence d'un rayonnement microonde: possibilités de diagnostic du plasmaGAVRILENKO, V. P.Fizika plazmy (Moskva, 1975). 1989, Vol 15, Num 1, pp 90-96, issn 0134-5052Article

Resonant modification of quasistatic profiles of spectral lines of hydrogen in a plasma under the influence of noncollinear harmonic electric fieldsGAVRILENKO, V. P.Soviet physics, JETP. 1991, Vol 72, Num 4, pp 624-630, issn 0038-5646Article

Spectre d'un atome hydrogénoïde dans un champ de rayonnement électromagnétique de haute fréquence: solution analytiqueGAVRILENKO, V. P.ZETF. Pis′ma v redakciû. 1986, Vol 90, Num 3, pp 857-865, issn 0044-4510Article

Towards the design of tunable X-ray lasers by dressing the plasma with the elliptically polarized radiation of an optical laserGAVRILENKO, V. P; OKS, E.The European physical journal. D, Atomic, molecular and optical physics (Print). 2004, Vol 28, Num 2, pp 253-257, issn 1434-6060, 5 p.Article

Nanometrology as a Key Part of the Infrastructure of NanotechnologyGAVRILENKO, V. P; TODUA, P. A.Nanotechnologies in Russia (Print). 2013, Vol 8, Num 5-6, pp 328-336, issn 1995-0780, 9 p.Article

Drastic influence of plasma quasi-static electric fields on satellites of helium forbidden linesOKS, E. A; GAVRILENKO, V. P.Optics communications. 1986, Vol 56, Num 6, pp 415-417, issn 0030-4018Article

Spectroscopic method for determining the polarization state of oscillating electric fields in plasmasGAVRILENKO, V. P; PARSONS, V. P.Journal of experimental and theoretical physics (Print). 1993, Vol 76, Num 2, pp 236-240, issn 1063-7761Article

Spectroscopie intra-Stark des radiateurs coulombiens dans un plasma à champ électrique quasi-monochromatiqueGAVRILENKO, V. P; OKS, E. A.Fizika plazmy (Moskva, 1975). 1987, Vol 13, Num 1, pp 39-50, issn 0134-5052Article

Transitions résonnantes multiphotoniques entre les sous-niveaux d'un atome habillé, séparés par la fréquence de RabiGAVRILENKO, V. P; OKS, E. A.Žurnal tehničeskoj fiziki. 1987, Vol 57, Num 1, pp 22-27, issn 0044-4642Article

Spectral line broadening of multiply charged helium-like ions in a dense high-temperature plasmaGAVRILENKO, V. P; ISPOLATOV, YA. O.Optika i spektroskopiâ. 1990, Vol 68, Num 5, pp 1000-1005, issn 0030-4034, 6 p.Article

On new possibilities of measuring electric field in plasmas using molecule emission spectraGAVRILENKO, V. P; OKS, E. A.Optics communications. 1989, Vol 69, Num 5-6, pp 384-386, issn 0030-4018Article

Use of fluorescence spectroscopy of hydrogen atoms and BH molecules for measurements of electric fields in a plasmaCHERKASOVA, E. K; GAVRILENKO, V. P; ZHUZHUNASHVILI, A. I et al.Journal of physics. D, Applied physics (Print). 2006, Vol 39, Num 3, pp 477-483, issn 0022-3727, 7 p.Article

Détection et analyse des champs électriques oscillants dans le plasma périphérique du Tokamak sur la base d'un nouvel effet spectroscopiqueGAVRILENKO, V. P; OKS, E. A; RANTSEV-KARTINOV, V. A et al.Pis′ma v žurnal èksperimental′noj i teoretičeskoj fiziki. 1986, Vol 44, Num 7, pp 315-317, issn 0370-274XArticle

Calibration of a scanning electron microscope in the wide range of magnifications for the microscope operation in the integrated circuit production lineGAVRILENKO, V. P; NOVIKOV, Yu. A; RAKOV, A. V et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7272, issn 0277-786X, isbn 978-0-8194-7525-1 0-8194-7525-4, 72720Z.1-72720Z.12, 2Conference Paper

Test objects for automated dimensional measurements at the nanoscale level using a scanning electron microscopeGAVRILENKO, V. P; FILIPPOV, M. N; NOVIKOV, Yu. A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 737813.1-737813.8Conference Paper

Anomalous Electric fields inside a dense plasma of a current sheetFRANK, A. G; GAVRILENKO, V. P; ISPOLATOV, YA. O et al.Contributions to plasma physics (1985). 1996, Vol 36, Num 6, pp 667-678, issn 0863-1042Article

L'atome hydrogénoïde dans le champ d'un rayonnement électromagnétique de haute fréquence polarisé rectilignementGAVRILENKO, V. P; OKS, E. A; RADCHIK, A. V et al.Optika i spektroskopiâ. 1985, Vol 59, Num 3, pp 683-685, issn 0030-4034Article

Measurement of thickness of native silicon dioxide with a scanning electron microscopeGAVRILENKO, V. P; NOVIKOV, Yu. A; RAKOV, A. V et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7405, issn 0277-786X, isbn 978-0-8194-7695-1 0-8194-7695-1, 1Vol, 740507.1-740507.8Conference Paper

X-ray-line plasma satellites of ions in a dense plasma produced by a picosecond laser pulseGAVRILENKO, V. P; BELYAEV, V. S; PIKUZ, S. A et al.Journal of physics. A, mathematical and general. 2006, Vol 39, Num 17, pp 4353-4358, issn 0305-4470, 6 p.Conference Paper

Check of the quality of fabrication of test objects with a trapezoidal profileTODUA, P. A; GAVRILENKO, V. P; NOVIKOV, Yu. A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7042, pp 704209.1-704209.8, issn 0277-786X, isbn 978-0-8194-7262-5 0-8194-7262-X, 1VolConference Paper

Measurement of the parameters of the electron beam of a scanning electron microscopeGAVRILENKO, V. P; NOVIKOV, Yu. A; RAKOV, A. V et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7042, pp 70420C.1-70420C.12, issn 0277-786X, isbn 978-0-8194-7262-5 0-8194-7262-X, 1VolConference Paper

Spectroscopic study of anomalous electric fields in peripheral regions of a current sheet plasmaFRANK, A. G; GAVRILENKO, V. P; KYRIE, N. P et al.Journal of physics. B. Atomic, molecular and optical physics (Print). 2006, Vol 39, Num 24, pp 5119-5129, issn 0953-4075, 11 p.Article

Dramatic enhancement of the high-order harmonic generation by using either dipole media or a double multiquantum resonanceOKS, E; GAVRILENKO, V. P.Journal de physique. IV. 2001, Vol 82, pp Pr2.365-Pr2.368, issn 1155-4339Conference Paper

Measurements of electric fields in a discharge plasma using laser optogalvanic detection of the Stark effect of argon atomsBOWDEN, M. D; GAVRILENKO, V. P; IKUTAKE, T et al.Contributions to plasma physics (1985). 2000, Vol 40, Num 1-2, pp 113-119, issn 0863-1042Article

Accuracy of ellipsometric measurements of Si-SiO2 structuresGAVRILENKO, V. P; NOVIKOV, Yu. A; RAKOV, A. V et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7718, issn 0277-786X, isbn 978-0-8194-8191-7, 77181B.1-77181B.10Conference Paper